Invention Grant
US08849836B2 Method for measuring similarity of diverse binary objects comprising bit patterns 有权
用于测量包含位模式的不同二进制对象的相似度的方法

Method for measuring similarity of diverse binary objects comprising bit patterns
Abstract:
An apparatus, system, and method for measuring the similarity of binary objects is disclosed. The method determines at least one pattern signature in an Nth binary object, accessing a location in a similarity store which has object identifiers for each of the previous N−1 binary objects which contain the corresponding pattern, and writing the object identifier of the Nth binary object at that same location in the similarity store. Reporting the number of locations in similarity store which contain the object identifiers of two apparently diverse binary objects is a measure of similarity to each other.
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