Invention Grant
- Patent Title: Test selection
- Patent Title (中): 测试选择
-
Application No.: US13552665Application Date: 2012-07-19
-
Publication No.: US08850270B2Publication Date: 2014-09-30
- Inventor: Andre Heiper , Aharon Kupershtok , Yaakov Yaari
- Applicant: Andre Heiper , Aharon Kupershtok , Yaakov Yaari
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Riv Goldberg
- Main IPC: G06F11/00
- IPC: G06F11/00

Abstract:
Computer-implemented method, computerized apparatus and a computer program product for test selection. The computer-implemented method comprising: obtaining a test suite comprising a plurality of tests for a Software Under Test (SUT); and selecting a subset of the test suite, wherein the subset provides coverage of the SUT that correlates to a coverage by a workload of the SUT, wherein the workload defines a set of input events to the SUT thereby defining portions of the SUT that are to be invoked during execution.
Public/Granted literature
- US20140025997A1 Test Selection Public/Granted day:2014-01-23
Information query