Invention Grant
- Patent Title: Component aperture location using computed tomography
- Patent Title (中): 使用计算机断层扫描的组件孔径位置
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Application No.: US13307458Application Date: 2011-11-30
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Publication No.: US08861673B2Publication Date: 2014-10-14
- Inventor: Derek J. Michaels , Rodney H. Warner
- Applicant: Derek J. Michaels , Rodney H. Warner
- Applicant Address: US CT Hartford
- Assignee: United Technologies Corporation
- Current Assignee: United Technologies Corporation
- Current Assignee Address: US CT Hartford
- Agency: Carlson, Gaskey, & Olds, P.C.
- Main IPC: A61B6/00
- IPC: A61B6/00
Abstract:
An exemplary component measuring method includes determining a position of an aperture of a component using a computed tomography scan of a gage and a component. The gage is inserted into the aperture of the component during the computed tomography scan.
Public/Granted literature
- US20130136225A1 COMPONENT APERTURE LOCATION USING COMPUTED TOMOGRAPHY Public/Granted day:2013-05-30
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