Invention Grant
- Patent Title: Material testing system
- Patent Title (中): 材料检测系统
-
Application No.: US13695974Application Date: 2010-05-06
-
Publication No.: US08863583B2Publication Date: 2014-10-21
- Inventor: Takehiko Fukuda
- Applicant: Takehiko Fukuda
- Applicant Address: JP Kyoto-shi
- Assignee: Shimadzu Corporation
- Current Assignee: Shimadzu Corporation
- Current Assignee Address: JP Kyoto-shi
- Agency: Westerman, Hattori, Daniels & Adrian, LLP
- International Application: PCT/JP2010/057755 WO 20100506
- International Announcement: WO2011/138825 WO 20111110
- Main IPC: G01L1/24
- IPC: G01L1/24 ; G01N3/04 ; G01N3/06

Abstract:
Provided is a material testing system provided with: an upper gripper 21 and a lower gripper 22 that grip a test piece 10; a video camera 18 that photographs the upper gripper 21 and the lower gripper 22 and the test piece 10; a first display part 25; a second display part 26; and a setting support section 61 that, in order to do test preparation where the test piece 10 is made to be gripped by the upper gripper 21 and the lower gripper 22, on the second display part 26, together with an image around the upper gripper 21 and the lower gripper 22, displays setting position indicators that support at least any one of positioning of the grippers, attachment of the test piece, and placement of gage marks to be marked on the test piece that is in a state of being gripped by the grippers.
Public/Granted literature
- US20130042696A1 MATERIAL TESTING MACHINE Public/Granted day:2013-02-21
Information query