Invention Grant
- Patent Title: Analysis apparatus and analysis method
- Patent Title (中): 分析仪器及分析方法
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Application No.: US12875913Application Date: 2010-09-03
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Publication No.: US08865072B2Publication Date: 2014-10-21
- Inventor: Takaaki Nagai , Yuichi Hamada , Masaharu Shibata
- Applicant: Takaaki Nagai , Yuichi Hamada , Masaharu Shibata
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2008-57382 20080307; JP2008-57661 20080307; JP2008-57972 20080307; JP2008-58007 20080307; JP2008-58302 20080307
- Main IPC: G01N33/00
- IPC: G01N33/00 ; G01N33/48 ; G01N35/02 ; G01N21/00 ; G01N15/06 ; G01N35/00

Abstract:
This analysis apparatus includes a transporter transporting the specimens to the first measurement unit and the second measurement unit, and a control portion so controlling the transporter as to transport a first specimen container, stored in the rack, storing a first specimen to the first measurement unit and as to transport a second specimen container, stored in the rack along with the first specimen container, storing a second specimen to the second measurement unit.
Public/Granted literature
- US20100330609A1 ANALYSIS APPARATUS AND ANALYSIS METHOD Public/Granted day:2010-12-30
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