Invention Grant
- Patent Title: Charged-particle beam irradiation device
- Patent Title (中): 带电粒子束照射装置
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Application No.: US14068190Application Date: 2013-10-31
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Publication No.: US08866109B2Publication Date: 2014-10-21
- Inventor: Kenzo Sasai
- Applicant: Sumitomo Heavy Industries, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee: Sumitomo Heavy Industries, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Squire Patton Boggs (US) LLP
- Priority: JP2011-106562 20110511
- Main IPC: G21K5/04
- IPC: G21K5/04 ; A61N5/10 ; G21K1/093

Abstract:
A charged-particle beam irradiation device, which irradiates an irradiation target with a charged-particle beam, includes a transport line that transports the charged-particle beam and a rotating gantry that is rotatable about a rotation axis. The transport line includes an inclination portion making the charged-particle beam travel so that the charged-particle beam is inclined to be separated from the rotation axis, and is formed to turn the charged-particle beam in a rotation direction of the rotation axis and to bend the charged-particle beam, which has turned in the rotation direction, toward the rotation axis. The rotating gantry is formed of a cylindrical portion that receives the irradiation target and supports the transport line. The inclination portion is disposed in the cylindrical portion of the rotating gantry. The charged-particle beam irradiation device further includes blocking members that block radiation emitted from the transport line disposed in the cylindrical portion.
Public/Granted literature
- US20140058186A1 CHARGED-PARTICLE BEAM IRRADIATION DEVICE Public/Granted day:2014-02-27
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