Invention Grant
- Patent Title: Multiple metal film stack in BSI chips
- Patent Title (中): BSI芯片中的多个金属膜堆叠
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Application No.: US13789820Application Date: 2013-03-08
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Publication No.: US08866250B2Publication Date: 2014-10-21
- Inventor: Shyh-Fann Ting , Ching-Chun Wang
- Applicant: Taiwan Semiconductor Manufacturing Company, Ltd.
- Applicant Address: TW Hsin-Chu
- Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
- Current Assignee Address: TW Hsin-Chu
- Agency: Slater & Matsil, L.L.P.
- Main IPC: H01L27/146
- IPC: H01L27/146 ; H01L21/00

Abstract:
A device includes a semiconductor substrate, a black reference circuit in the semiconductor substrate, a metal pad on a front side of, and underlying, the semiconductor substrate, and a first and a second conductive layer. The first conductive layer includes a first portion penetrating through the semiconductor substrate to connect to the metal pad, and a second portion forming a metal shield on a backside of the semiconductor substrate. The metal shield is aligned to the black reference circuit, and the first portion and the second portion are interconnected to form a continuous region. The second conductive layer includes a portion over and contacting the first portion of the first conductive layer, wherein the first portion of the first conductive layer and the portion of the second conductive layer form a first metal pad. A dielectric layer is overlying and contacting the second portion of the first conductive layer.
Public/Granted literature
- US20140061839A1 Multiple Metal Film Stack in BSI Chips Public/Granted day:2014-03-06
Information query
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