Invention Grant
US08867042B2 Method for evaluating characteristic of optical modulator having mach-zehnder interferometer
有权
用于评估马赫 - 泽德干涉仪的光学调制器特性的方法
- Patent Title: Method for evaluating characteristic of optical modulator having mach-zehnder interferometer
- Patent Title (中): 用于评估马赫 - 泽德干涉仪的光学调制器特性的方法
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Application No.: US13394382Application Date: 2009-09-07
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Publication No.: US08867042B2Publication Date: 2014-10-21
- Inventor: Tetsuya Kawanishi , Akito Chiba , Junichiro Ichikawa , Masaaki Sudo
- Applicant: Tetsuya Kawanishi , Akito Chiba , Junichiro Ichikawa , Masaaki Sudo
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: National Institute of Information and Communications Technology,Sumitomo Osaka Cement Co., Ltd.
- Current Assignee: National Institute of Information and Communications Technology,Sumitomo Osaka Cement Co., Ltd.
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Posz Law Group, PLC
- International Application: PCT/JP2009/004406 WO 20090907
- International Announcement: WO2011/027409 WO 20110310
- Main IPC: G01B9/02
- IPC: G01B9/02 ; G02F1/225 ; G02B6/293 ; G02F1/21
Abstract:
A method for evaluating a characteristic of, especially, each of Mach-Zehnder interferometers (MZIs) of an optical modulator. The method includes a step of measuring the intensity of the output of the optical modulator containing MZIs and a step of evaluating a characteristic of each MZI by using the sideband. The output intensity measuring step is the one of measuring the intensity Sn,k of the sideband signal contained in the output light from the optical modulator. The characteristic evaluating step is the one of evaluating a characteristic of the MZIk by using the Sn,k.
Public/Granted literature
- US20120162656A1 METHOD FOR EVALUATING CHARACTERISTIC OF OPTICAL MODULATOR HAVING MACH-ZEHNDER INTERFEROMETER Public/Granted day:2012-06-28
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