Invention Grant
- Patent Title: Method and apparatus for measuring a position of a particle in a flow
- Patent Title (中): 用于测量流中颗粒位置的方法和装置
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Application No.: US13662197Application Date: 2012-10-26
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Publication No.: US08867046B2Publication Date: 2014-10-21
- Inventor: Thomas H. Jeys , Antonio Sanchez-Rubio , Ronald H. Hoffeld , Jonathan Z. Lin , Nicholas M. F. Judson , George S. Haldeman , Vincenzo Daneu
- Applicant: Massachusetts Institute of Technology
- Applicant Address: US MA Cambridge
- Assignee: Massachusetts Institute of Technology
- Current Assignee: Massachusetts Institute of Technology
- Current Assignee Address: US MA Cambridge
- Agency: Hamilton, Brook, Smith & Reynolds, P.C.
- Main IPC: G01B11/14
- IPC: G01B11/14 ; G01B11/00 ; G01N21/53 ; G01N15/14

Abstract:
A method and an apparatus of measuring a position of a particle in a flow are disclosed. An embodiment of the method comprises temporally modulating and spatially pattering an illumination beam propagating along a first dimension, passing a particle across the modulated illumination beam, detecting a temporal profile of scattered light produced by the particle's passing through the modulated illumination beam, and determining the position of the particle based, in part, on the temporal profile of the detected scattered light.
Public/Granted literature
- US20130077096A1 METHOD AND APPARATUS FOR MEASURING A POSITION OF A PARTICLE IN A FLOW Public/Granted day:2013-03-28
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