Invention Grant
- Patent Title: Point set matching with outlier detection
- Patent Title (中): 点集匹配异常值检测
-
Application No.: US13712222Application Date: 2012-12-12
-
Publication No.: US08867865B2Publication Date: 2014-10-21
- Inventor: Jinjun Wang , Jing Xiao
- Applicant: Seiko Epson Corporation
- Applicant Address: JP Tokyo
- Assignee: Seiko Epson Corporation
- Current Assignee: Seiko Epson Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G06K9/54
- IPC: G06K9/54 ; G06K9/62

Abstract:
Aspects of the present invention include point set matching systems and methods. In embodiments, a tree model is used to find candidate matching locations for a set of query points. In embodiments, a similitude transform is assumed, and the parameters are separately solved to reduce computation complexity. In embodiments, the dominant scaling (α) and rotation (R) parameters are obtained by identifying a maximum in an accumulator space. A translation (t) matrix is calculated in another 1D accumulator space. With the obtained similitude transform, outliers can be reliably detected. This two-stage approach reduces the complexity and calculation time of determining a similitude transform and increases the accuracy and ability to detect outliers.
Public/Granted literature
- US20140133762A1 Point Set Matching with Outlier Detection Public/Granted day:2014-05-15
Information query