Invention Grant
- Patent Title: Optical analyzer
- Patent Title (中): 光学分析仪
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Application No.: US12858087Application Date: 2010-08-17
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Publication No.: US08868158B2Publication Date: 2014-10-21
- Inventor: Takemi Hasegawa
- Applicant: Takemi Hasegawa
- Applicant Address: JP Osaka-shi
- Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee: Sumitomo Electric Industries, Ltd.
- Current Assignee Address: JP Osaka-shi
- Agency: Venable LLP
- Agent Michael A. Sartori; Tamatane J. Aga
- Priority: JP2006-013010 20060120
- Main IPC: A61B6/00
- IPC: A61B6/00 ; B07C5/342 ; A61B5/00 ; G01N21/65 ; G01N21/35

Abstract:
An optical analyzer performing analysis excellent in spatial resolution and in invasion depth is provided. The analyzer includes a diagnostic light source section including a seed light source which outputs seed light, and a silica optical fiber to which seed light is input and which generates diagnostic light having a HE11 mode field pattern utilizing a nonlinear optical phenomenon, an irradiation optical system converging the diagnostic light and irradiating a measurement subject with the diagnostic light, an acquisition optical system acquiring object light generated at the measurement subject, a spectrum measurement section receiving the object light and measuring a frequency spectrum of the object light, a storage section storing information of a frequency spectrum of a known substance, and an arithmetic section calculating a correspondence between the frequency spectrum of the object light and the frequency spectrum of the known substance, and analyzing the measurement subject based on the calculation result.
Public/Granted literature
- US20100331706A1 OPTICAL ANALYZER Public/Granted day:2010-12-30
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