Invention Grant
- Patent Title: Method and apparatus for assessing neural activation
- Patent Title (中): 用于评估神经激活的方法和装置
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Application No.: US13446459Application Date: 2012-04-13
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Publication No.: US08868173B2Publication Date: 2014-10-21
- Inventor: Dwight E. Nelson , Rahul Agarwal , Steven L. Jensen , Rahul Gupta
- Applicant: Dwight E. Nelson , Rahul Agarwal , Steven L. Jensen , Rahul Gupta
- Applicant Address: US MN Minneapolis
- Assignee: Medtronic, Inc.
- Current Assignee: Medtronic, Inc.
- Current Assignee Address: US MN Minneapolis
- Agency: Medtronic, Inc.
- Main IPC: A61B5/04
- IPC: A61B5/04 ; A61B5/0476 ; A61N1/36 ; A61N1/372 ; A61B5/0496 ; A61M5/142 ; A61N1/05

Abstract:
Various embodiments concern sensing a LFP signal from one or more electrodes, measuring the amplitude of the signals over a period of time, and calculating a plurality of variance values from the amplitude, wherein each of the variance values correspond to the variance of the amplitude for a different interval of time of the period of time with respect to the other variance values. Such embodiments may further include assessing the relative level of neural activation of an area of the brain based on the variance values, wherein the area of the brain is assessed to have a relatively higher level of neural activation when the variance is relatively higher and the area of the brain is assessed to have a relatively lower level of neural activation when the variance is relatively lower.
Public/Granted literature
- US20120271189A1 METHOD AND APPARATUS FOR ASSESSING NEURAL ACTIVATION Public/Granted day:2012-10-25
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