Invention Grant
- Patent Title: Sample analyzing system, sample analyzer and management apparatus
- Patent Title (中): 样品分析系统,样品分析仪和管理仪器
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Application No.: US13240536Application Date: 2011-09-22
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Publication No.: US08868370B2Publication Date: 2014-10-21
- Inventor: Naoki Shindo , Yusuke Suga , Aya Konishi , Daigo Fukuma , Keisuke Kuwano
- Applicant: Naoki Shindo , Yusuke Suga , Aya Konishi , Daigo Fukuma , Keisuke Kuwano
- Applicant Address: JP Kobe-shi, Hyogo
- Assignee: Sysmex Corporation
- Current Assignee: Sysmex Corporation
- Current Assignee Address: JP Kobe-shi, Hyogo
- Agency: Brinks Gilson & Lione
- Priority: JP2010-214540 20100924
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G01N35/00

Abstract:
The present invention is a sample analyzing system, including a sample analyzer and a management apparatus connected to the sample analyzer via a communication network. The management apparatus includes: a first memory that stores a computer program for the sample analyzer and manual data which corresponds to a version of the computer program; a first communication device; and a first controller configured to transmit, via the first communication device to the sample analyzer, the computer program and the manual data corresponding to the version of the computer program stored in the first memory. The sample analyzer includes: a second communication device; a second memory that stores the computer program and the manual data received by the second communication device; and a second controller configured to execute the computer program stored in the second memory.
Public/Granted literature
- US20120078514A1 SAMPLE ANALYZING SYSTEM, SAMPLE ANALYZER AND MANAGEMENT APPARATUS Public/Granted day:2012-03-29
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