Methods, apparatus, and articles of manufacture to collect process control data are disclosed. An example method to collect process control data includes registering an electronic device description describing a parameter to be measured and a measurement sampling rate, measuring the parameter based on the measurement sampling rate, storing data representative of the measured parameter in a data structure, and transferring data in the data structure to a first process control device via a process control network in response to at least one of a request for the data, a condition associated with the data, or an event associated with the data.