Invention Grant
- Patent Title: System-level testcase generation
- Patent Title (中): 系统级测试用例生成
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Application No.: US12939189Application Date: 2010-11-04
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Publication No.: US08868976B2Publication Date: 2014-10-21
- Inventor: Shimon Ben-Yehuda , Shady Copty , Alex Goryachev , John David Jabusch , Ronny Morad
- Applicant: Shimon Ben-Yehuda , Shady Copty , Alex Goryachev , John David Jabusch , Ronny Morad
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Ziv Glazberg
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263 ; G06F11/36

Abstract:
A system-level testcase may be generated by performing system-level generation tasks by a system-level generator to produce an abstract testcase. Based upon the abstract testcase, one or more unit-level generators may generate the testcase. The testcase may be utilized in simulation of operation of a system-under-test (SUT). The testcase may be utilized for verification of the SUT. The SUT may comprise a plurality of units. The unit-level generator may be associated with units of the SUT and perform generation tasks associated with pertinent units.
Public/Granted literature
- US20120117424A1 SYSTEM-LEVEL TESTCASE GENERATION Public/Granted day:2012-05-10
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