Invention Grant
- Patent Title: Robust memory link testing using memory controller
- Patent Title (中): 使用内存控制器的强大的内存链接测试
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Application No.: US12651252Application Date: 2009-12-31
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Publication No.: US08868992B2Publication Date: 2014-10-21
- Inventor: Bryan L. Spry , Theodore Z. Schoenborn , Philip Abraham , Christopher P. Mozak , David G. Ellis , Jay J. Nejedlo , Bruce Querbach , Zvika Greenfield , Rony Ghattas , Jayasekhar Tholiyil , Charles D. Lucas , Christopher E. Yunker
- Applicant: Bryan L. Spry , Theodore Z. Schoenborn , Philip Abraham , Christopher P. Mozak , David G. Ellis , Jay J. Nejedlo , Bruce Querbach , Zvika Greenfield , Rony Ghattas , Jayasekhar Tholiyil , Charles D. Lucas , Christopher E. Yunker
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Jordan IP Law, LLC
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G11C29/08
Abstract:
REUT (Robust Electrical Unified Testing) for memory links is introduced which speeds testing, tool development, and debug. In addition it provides training hooks that have enough performance to be used by BIOS to train parameters and conditions that have not been possible with past implementations. Address pattern generation circuitry is also disclosed.
Public/Granted literature
- US20110161752A1 ROBUST MEMORY LINK TESTING USING MEMORY CONTROLLER Public/Granted day:2011-06-30
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