Invention Grant
- Patent Title: Low drift scanning probe microscope
- Patent Title (中): 低漂移扫描探针显微镜
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Application No.: US13052901Application Date: 2011-03-21
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Publication No.: US08869310B2Publication Date: 2014-10-21
- Inventor: Anthonius Ruiter , Henry Mittel
- Applicant: Anthonius Ruiter , Henry Mittel
- Applicant Address: US CA Santa Barbara
- Assignee: Bruker Nano, Inc.
- Current Assignee: Bruker Nano, Inc.
- Current Assignee Address: US CA Santa Barbara
- Agency: Boyle Fredrickson S.C.
- Main IPC: G01Q10/00
- IPC: G01Q10/00 ; B82Y35/00 ; G01Q70/04

Abstract:
A scanning probe microscope, such as an atomic force microscope, include a z-stage and a bridge structure comprised substantially free of Invar. A scanner containing a probe is mounted to the z-stage, which is movable in the z-axis to raise and lower the probe. A drift compensation system is provided to reduce thermal drift of the z-stage and the bridge. The drift compensation system includes heating elements thermally coupled to the z-stage and the bridge, ambient temperature sensors, and a controller to actively control the heating elements to maintain the bridge and the z-stage at an elevated temperature.
Public/Granted literature
- US20110239336A1 Low Drift Scanning Probe Microscope Public/Granted day:2011-09-29
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