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US08873323B2 Method of executing wear leveling in a flash memory device according to ambient temperature information and related flash memory device 有权
根据环境温度信息和相关闪存器件在闪速存储器件中执行磨损均衡的方法

  • Patent Title: Method of executing wear leveling in a flash memory device according to ambient temperature information and related flash memory device
  • Patent Title (中): 根据环境温度信息和相关闪存器件在闪速存储器件中执行磨损均衡的方法
  • Application No.: US13586867
    Application Date: 2012-08-16
  • Publication No.: US08873323B2
    Publication Date: 2014-10-28
  • Inventor: Tseng-Ho Li
  • Applicant: Tseng-Ho Li
  • Applicant Address: TW NeiHu Dist, Taipei
  • Assignee: Transcend Information, Inc.
  • Current Assignee: Transcend Information, Inc.
  • Current Assignee Address: TW NeiHu Dist, Taipei
  • Agent Winston Hsu; Scott Margo
  • Main IPC: G11C7/04
  • IPC: G11C7/04
Method of executing wear leveling in a flash memory device according to ambient temperature information and related flash memory device
Abstract:
A method of executing wear leveling in a flash memory device includes determining whether a current temperature is in a normal operating temperature range of the flash memory device, and reprogramming data associated with data blocks to another location in a flash memory array when the current temperature is in the normal operating temperature range of the flash memory device, wherein the data is programmed in a temperature out of the normal operating temperature range of the flash memory device.
Abstract(Chinese):

在闪速存储器件中执行磨损均衡的方法包括确定当前温度是否处于闪速存储器件的正常工作温度范围内，以及当当前温度为当前温度时将与数据块相关联的数据重新编程到闪存阵列中的另一个位置 在闪速存储器件的正常工作温度范围内，其中数据在闪存器件的正常工作温度范围内的温度下编程。

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