Invention Grant
- Patent Title: Distance-to-fault measurement system capable of measuring complex reflection coefficients
- Patent Title (中): 能够测量复杂反射系数的距离故障测量系统
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Application No.: US12478822Application Date: 2009-06-05
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Publication No.: US08874391B2Publication Date: 2014-10-28
- Inventor: Matthew A. Taylor
- Applicant: Matthew A. Taylor
- Applicant Address: US NH Nashua
- Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee: BAE Systems Information and Electronic Systems Integration Inc.
- Current Assignee Address: US NH Nashua
- Agency: Finch & Maloney PLLC
- Main IPC: G01R31/08
- IPC: G01R31/08 ; G06F19/00 ; G01R31/28 ; G01R27/04 ; G01R31/11

Abstract:
Techniques are disclosed for computing distance-to-fault (DTF) in communication systems. The techniques can be embodied, for instance, in a DTF system that provides a multi-port probing device and DTF functionality, including computing distances to faults and the fault magnitudes. In addition, the DTF system is further configured with the ability to accurately measure complex reflection coefficient of the UUT, and/or return loss of the UUT. The complex reflection coefficient and/or return loss of the UUT can be computed as a function of known scattering parameters of a multi-port measurement circuit included in the probe of the DTF system.
Public/Granted literature
- US20100312506A1 DISTANCE-TO-FAULT MEASUREMENT SYSTEM CAPABLE OF MEASURING COMPLEX REFLECTION COEFFICIENTS Public/Granted day:2010-12-09
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