Invention Grant
- Patent Title: Test chamber with temperature and humidity control
- Patent Title (中): 测试室具有温湿度控制
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Application No.: US11957111Application Date: 2007-12-14
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Publication No.: US08875528B2Publication Date: 2014-11-04
- Inventor: Darin E. Immink , Clinton A. Peterson , Andrew R. Veldt
- Applicant: Darin E. Immink , Clinton A. Peterson , Andrew R. Veldt
- Applicant Address: US WI Pewaukee
- Assignee: Venturedyne, Ltd.
- Current Assignee: Venturedyne, Ltd.
- Current Assignee Address: US WI Pewaukee
- Agency: Michael Best & Friedrich LLP
- Main IPC: F25D9/00
- IPC: F25D9/00 ; F25D21/00 ; F24F3/14 ; F25B41/04

Abstract:
A test chamber that is capable of operating in a mode where the temperature of the chamber is efficiently cooled without removing a substantial amount of moisture from the air. In one aspect, the test chamber includes a structure defining a work space having air, and a temperature control system (e.g., a refrigeration system having a compressor, a condenser, and an evaporator valve). The temperature control system includes a heat exchanger (e.g., an evaporator) positioned to communicate with the air in the work space, a source of cold fluid (e.g., a compressed, condensed, and throttled refrigerant) coupled to the heat exchanger, a source of hot fluid (e.g., compressed refrigerant gas) coupled to the heat exchanger, and a controller for controlling a mixture of cold fluid and hot fluid entering the heat exchanger (e.g., by adjusting a cold fluid valve and/or a hot fluid valve). In order to limit the loss of humidity caused by condensation on the heat exchanger, it is preferred that the controller is programmed such that the temperature of the mixture entering the heat exchanger is controlled to limit a temperature differential between the heat exchanger and the air in the work space.
Public/Granted literature
- US20090151370A1 TEST CHAMBER WITH TEMPERATURE AND HUMIDITY CONTROL Public/Granted day:2009-06-18
Information query
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