Invention Grant
- Patent Title: Objective quality metric for ocular wavefront measurements
- Patent Title (中): 眼波前测量的客观质量指标
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Application No.: US12830221Application Date: 2010-07-02
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Publication No.: US08876290B2Publication Date: 2014-11-04
- Inventor: Edwin Jay Sarver , Thomas D. Padrick , Max Hall
- Applicant: Edwin Jay Sarver , Thomas D. Padrick , Max Hall
- Applicant Address: US CA Aliso Viejo
- Assignee: Wavetec Vision Systems, Inc.
- Current Assignee: Wavetec Vision Systems, Inc.
- Current Assignee Address: US CA Aliso Viejo
- Agency: Knobbe Martens Olson & Bear LLP
- Main IPC: A61B3/14
- IPC: A61B3/14 ; A61B3/10
Abstract:
A system and method for determining an objective quality metric for image data collected by a wavefront aberrometer. The method may include quantifying a plurality of characteristics of the image data and calculating the objective quality metric based on the quantified characteristics of the image data. The objective quality metric can be a weighted sum of the quantified characteristics of the image data. The weightings for the weighted sum can be determined based on subjective quality metrics assigned to a set of training image data by a human expert.
Public/Granted literature
- US20110007270A1 OBJECTIVE QUALITY METRIC FOR OCULAR WAVEFRONT MEASUREMENTS Public/Granted day:2011-01-13
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