Invention Grant
US08877442B2 Non-invasive determination of fetal inheritance of parental haplotypes at the genome-wide scale
有权
在全基因组范围内非侵入性测定亲本单倍型的胎儿遗传
- Patent Title: Non-invasive determination of fetal inheritance of parental haplotypes at the genome-wide scale
- Patent Title (中): 在全基因组范围内非侵入性测定亲本单倍型的胎儿遗传
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Application No.: US13313909Application Date: 2011-12-07
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Publication No.: US08877442B2Publication Date: 2014-11-04
- Inventor: Stephen R. Quake , Hei-Mun C. Fan
- Applicant: Stephen R. Quake , Hei-Mun C. Fan
- Applicant Address: US CA Palo Alto
- Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee: The Board of Trustees of the Leland Stanford Junior University
- Current Assignee Address: US CA Palo Alto
- Agency: Rothwell, Figg, Ernst & Manbeck, P.C.
- Main IPC: C12Q1/68
- IPC: C12Q1/68

Abstract:
The present invention provides a method, device and a computer program for haplotyping single cells, such that a sample taken from a pregnant female, without directly sampling the fetus, provides the ability to non-invasively determine the fetal genome. The method can be performed by determining the parental and inherited haplotypes, or can be performed merely on the basis of the mother's genetic information, obtained preferably in a blood or serum sample. The novel device allows for sequence analysis of single chromosomes from a single cell, preferably by partitioning single chromosomes from a metaphase cell into long, thin channels where a sequence analysis can be performed.
Public/Granted literature
- US20120196754A1 NON-INVASIVE DETERMINATION OF FETAL INHERITANCE OF PARENTAL HAPLOTYPES AT THE GENOME-WIDE SCALE Public/Granted day:2012-08-02
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