Invention Grant
US08877568B2 Methods of making logic transistors and non-volatile memory cells
有权
制造逻辑晶体管和非易失性存储单元的方法
- Patent Title: Methods of making logic transistors and non-volatile memory cells
- Patent Title (中): 制造逻辑晶体管和非易失性存储单元的方法
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Application No.: US13781727Application Date: 2013-02-28
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Publication No.: US08877568B2Publication Date: 2014-11-04
- Inventor: Mehul D. Shroff , Mark D. Hall
- Applicant: Mehul D. Shroff , Mark D. Hall
- Applicant Address: US TX Austin
- Assignee: Freescale Semiconductor, Inc.
- Current Assignee: Freescale Semiconductor, Inc.
- Current Assignee Address: US TX Austin
- Agent Sherry W. Schumm
- Main IPC: H01L21/335
- IPC: H01L21/335 ; H01L21/8232 ; H01L27/115 ; H01L21/28

Abstract:
Methods of making a logic transistor in a logic region and an NVM cell in an NVM region of a substrate include forming a conductive layer on a gate dielectric, patterning the conductive layer over the NVM region, removing the conductive layer over the logic region, forming a dielectric layer over the NVM region, forming a protective layer over the dielectric layer, removing the dielectric layer and the protective layer from the logic region, forming a high-k dielectric layer over the logic region and a remaining portion of the protective layer, and forming a first metal layer over the high-k dielectric layer. The first metal layer, the high-k dielectric, and the remaining portion of the protective layer are removed over the NVM region. A conductive layer is deposited over the remaining portions of the dielectric layer and over the first metal layer, and the conductive layer is patterned.
Public/Granted literature
- US20130178054A1 METHODS OF MAKING LOGIC TRANSISTORS AND NON-VOLATILE MEMORY CELLS Public/Granted day:2013-07-11
Information query
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