Invention Grant
- Patent Title: Method for manufacturing SOI substrate
- Patent Title (中): 制造SOI衬底的方法
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Application No.: US13346930Application Date: 2012-01-10
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Publication No.: US08877607B2Publication Date: 2014-11-04
- Inventor: Junichi Koezuka
- Applicant: Junichi Koezuka
- Applicant Address: JP Atsugi-shi, Kanagawa-ken
- Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee: Semiconductor Energy Laboratory Co., Ltd.
- Current Assignee Address: JP Atsugi-shi, Kanagawa-ken
- Agency: Robinson Intellectual Property Law Office, P.C.
- Agent Eric J. Robinson
- Priority: JP2011-005490 20110114
- Main IPC: H01L21/762
- IPC: H01L21/762

Abstract:
To suppress desorption of hydrogen ions with which a single crystal semiconductor substrate is irradiated. A method for manufacturing an SOI substrate includes the following steps: irradiating a semiconductor substrate with carbon ions; irradiating the semiconductor substrate with a hydrogen ion after the irradiation with the carbon ion so as to form an embrittled region in the semiconductor substrate; disposing a surface of the semiconductor substrate and a surface of a base substrate to face each other and to be in contact with each other so that the semiconductor substrate and the base substrate are bonded; and heating the semiconductor substrate and the base substrate which are bonded to each other and separating the semiconductor substrate along the embrittled region so that a semiconductor layer is formed over the base substrate.
Public/Granted literature
- US20120184085A1 METHOD FOR MANUFACTURING SOI SUBSTRATE Public/Granted day:2012-07-19
Information query
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