Invention Grant
- Patent Title: Semiconductor device having a drain-gate isolation portion
- Patent Title (中): 具有漏极 - 栅极隔离部分的半导体器件
-
Application No.: US13941458Application Date: 2013-07-13
-
Publication No.: US08878294B2Publication Date: 2014-11-04
- Inventor: Mitsuo Kojima , Shoji Takei
- Applicant: Rohm Co., Ltd.
- Applicant Address: JP Kyoto
- Assignee: Rohm Co., Ltd.
- Current Assignee: Rohm Co., Ltd.
- Current Assignee Address: JP Kyoto
- Agency: Rabin & Berdo, P.C.
- Priority: JP2007-161493 20070619
- Main IPC: H01L27/092
- IPC: H01L27/092 ; H01L21/8238 ; H01L29/08 ; H01L29/66 ; H01L29/78 ; H01L27/088 ; H01L29/06 ; H01L29/10

Abstract:
An inventive semiconductor device includes a semiconductor layer, a source region provided in a surface layer portion of the semiconductor layer, a drain region provided in the surface of the semiconductor layer in spaced relation from the source region, a gate insulation film provided in opposed relation to a portion of the surface of the semiconductor layer present between the source region and the drain region, a gate electrode provided on the gate insulation film, and a drain-gate isolation portion provided between the drain region and the gate insulation film for isolating the drain region and the gate insulation film from each other in non-contact relation.
Public/Granted literature
- US20130292765A1 SEMICONDUCTOR DEVICE HAVING A DRAIN-GATE ISOLATION PORTION Public/Granted day:2013-11-07
Information query
IPC分类: