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US08878294B2 Semiconductor device having a drain-gate isolation portion 有权
具有漏极 - 栅极隔离部分的半导体器件

Semiconductor device having a drain-gate isolation portion
Abstract:
An inventive semiconductor device includes a semiconductor layer, a source region provided in a surface layer portion of the semiconductor layer, a drain region provided in the surface of the semiconductor layer in spaced relation from the source region, a gate insulation film provided in opposed relation to a portion of the surface of the semiconductor layer present between the source region and the drain region, a gate electrode provided on the gate insulation film, and a drain-gate isolation portion provided between the drain region and the gate insulation film for isolating the drain region and the gate insulation film from each other in non-contact relation.
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