Invention Grant
- Patent Title: Method for determining a distance and an integrated magnetic field measuring device
- Patent Title (中): 确定距离的方法和集成磁场测量装置
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Application No.: US13657156Application Date: 2012-10-22
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Publication No.: US08878524B2Publication Date: 2014-11-04
- Inventor: Klaus Heberle
- Applicant: Micronas GmbH
- Applicant Address: DE Freiburg
- Assignee: Micronas GmbH
- Current Assignee: Micronas GmbH
- Current Assignee Address: DE Freiburg
- Agency: Muncy, Geissler, Olds & Lowe, P.C.
- Priority: DE102011116545 20111021
- Main IPC: G01B7/14
- IPC: G01B7/14 ; G01R29/04 ; G01D5/14 ; G01R33/07 ; G01B7/02 ; H01L43/06

Abstract:
An integrated magnetic field measuring device is provided that includes a semiconductor body arranged on a metal substrate and having a first surface, and a plurality of metal surfaces formed on the surface, a first magnetic field sensor, formed in the semiconductor body and having a first sensor signal, and second magnetic field sensor having a second sensor signal, and a current-carrying first conductor. A third magnetic field sensor with a third sensor signal is formed in the semiconductor body. The first magnetic field sensor, the second magnetic field sensor, and the third magnetic field sensor have a substantially identical orientation to Earth's magnetic field and a different distance to the first conductor and the magnetic field of the first conductor simultaneously penetrates the first magnetic field sensor, the second magnetic field sensor, and the third magnetic field sensor.
Public/Granted literature
- US20130099777A1 METHOD FOR DETERMINING A DISTANCE AND AN INTEGRATED MAGNETIC FIELD MEASURING DEVICE Public/Granted day:2013-04-25
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