Invention Grant
- Patent Title: Capacitance measurement device for a touch control device
- Patent Title (中): 一种用于触摸控制装置的电容测量装置
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Application No.: US13046780Application Date: 2011-03-14
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Publication No.: US08878555B2Publication Date: 2014-11-04
- Inventor: He-Wei Huang , Chun-Hung Chen , Chih-Yuan Chang
- Applicant: He-Wei Huang , Chun-Hung Chen , Chih-Yuan Chang
- Applicant Address: TW Hsinchu Science Park, Hsin-Chu
- Assignee: NOVATEK Microelectronics Corp.
- Current Assignee: NOVATEK Microelectronics Corp.
- Current Assignee Address: TW Hsinchu Science Park, Hsin-Chu
- Agent Winston Hsu; Scott Margo
- Priority: TW99114655A 20100507
- Main IPC: G01R27/26
- IPC: G01R27/26 ; H03K17/96 ; G06F3/044

Abstract:
A capacitance measurement device includes a charging control unit for charging a measured capacitor, a discharging control unit for discharging the measured capacitor, a first switch coupled to the measured capacitor and the charging control unit for controlling a connection between the measured capacitor and the charging control unit according to a first switching signal, a second switch coupled to the measured capacitor and the discharging control unit for controlling a connection between the measured capacitor and the discharging control unit according to a second switching signal, a first A/D converter coupled to the measured capacitor for converting a voltage signal on the measured capacitor into a first signal, and a duty cycle detecting circuit coupled to the measured capacitor for converting the voltage signal on the measured capacitor into a count value that represents the capacitance of the measured capacitor and outputting the count value to a processing unit.
Public/Granted literature
- US20110273192A1 CAPACITANCE MEASUREMENT DEVICE FOR A TOUCH CONTROL DEVICE Public/Granted day:2011-11-10
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