Invention Grant
- Patent Title: Projection detecting apparatus and projection detecting method
- Patent Title (中): 投影检测装置和投影检测方法
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Application No.: US13126061Application Date: 2010-09-15
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Publication No.: US08878717B2Publication Date: 2014-11-04
- Inventor: Masahiro Yamamoto , Mitsutoshi Kenmochi , Toshihiro Sasaki
- Applicant: Masahiro Yamamoto , Mitsutoshi Kenmochi , Toshihiro Sasaki
- Applicant Address: JP Tokyo JP Tokyo
- Assignee: Nireco Corporation,JFE Steel Corporation
- Current Assignee: Nireco Corporation,JFE Steel Corporation
- Current Assignee Address: JP Tokyo JP Tokyo
- Agency: Squire Patton Boggs (US) LLP
- Priority: JP2009-247919 20091028
- International Application: PCT/JP2010/005630 WO 20100915
- International Announcement: WO2011/052130 WO 20110505
- Main IPC: G01S13/00
- IPC: G01S13/00 ; G01B15/08 ; G01S13/04
Abstract:
A projection detecting apparatus according to the present invention is that for detecting a projection on a surface of a running metal object, and includes a transmission antenna for radiating electromagnetic waves; a reception antenna for receiving reflected electromagnetic waves; and a transmission and reception signal processing section for processing a transmission signal and a reception signal. The transmission antenna and the reception antenna have unidirectionality and the transmission antenna and the reception antenna are installed in such a way that the reception antenna does not catch electromagnetic waves which have been radiated by the transmission antenna and reflected on the surface of the metal object and the reception antenna catches electromagnetic waves alone which have been radiated by the transmission antenna and reflected on the projection.
Public/Granted literature
- US20110241924A1 PROJECTION DETECTING APPARATUS AND PROJECTION DETECTING METHOD Public/Granted day:2011-10-06
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