Invention Grant
- Patent Title: Three dimensional shape measurement apparatus and method
- Patent Title (中): 三维形状测量装置及方法
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Application No.: US12787728Application Date: 2010-05-26
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Publication No.: US08878929B2Publication Date: 2014-11-04
- Inventor: Ho Kim , Kwang-Ill Kho , Hee-Wook You , Jae-Myeong Song
- Applicant: Ho Kim , Kwang-Ill Kho , Hee-Wook You , Jae-Myeong Song
- Applicant Address: KR Seoul
- Assignee: Koh Young Technology Inc.
- Current Assignee: Koh Young Technology Inc.
- Current Assignee Address: KR Seoul
- Agency: Kile Park Reed & Houtteman PLLC
- Priority: KR10-2009-0046669 20090527; KR10-2009-0046671 20090527; KR10-2010-0023521 20100316; KR10-2010-0047920 20100524
- Main IPC: H04N7/18
- IPC: H04N7/18 ; G01S17/36 ; G01B11/25 ; G01B11/22 ; G01S17/89 ; G06T7/00

Abstract:
A three dimensional shape measurement apparatus includes m projecting sections, each of which includes a light source and a grating element, and, while moving the grating element by n times, projects a grating pattern light onto a measurement target for each movement, wherein the ‘n’ and the ‘m’ are natural numbers greater than or equal to 2, an imaging section photographing a grating pattern image reflected by the measurement target, and a control section controlling that, while photographing the grating pattern image by using one of the m projecting sections, a grating element of at least another projecting section is moved. Thus, measurement time may be reduced.
Public/Granted literature
- US20100302364A1 THREE DIMENSIONAL SHAPE MEASUREMENT APPARATUS AND METHOD Public/Granted day:2010-12-02
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