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US08879827B2 Analyzing structured light patterns 有权
分析结构光模式

Analyzing structured light patterns
Abstract:
Systems and methods may include utilizing a structured light pattern that may be, among other things, decoded in the three directions (e.g., vertical, horizontal, and diagonal). In one example, the method may include detecting a first feature of a target image in a return image, designating a feature type of the first feature, and an index with the letter, wherein the index is associated with the pattern slide. The method may also include calculating a horizontal position in the pattern slide of the first feature, calculating a vertical position in the pattern slide of the first feature, and calculating a depth of the first feature.
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