Invention Grant
- Patent Title: Analyzing structured light patterns
- Patent Title (中): 分析结构光模式
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Application No.: US13538209Application Date: 2012-06-29
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Publication No.: US08879827B2Publication Date: 2014-11-04
- Inventor: Ziv Aviv , David Stanhill , Ron Ferens , Roi Ziss
- Applicant: Ziv Aviv , David Stanhill , Ron Ferens , Roi Ziss
- Applicant Address: US CA Santa Clara
- Assignee: Intel Corporation
- Current Assignee: Intel Corporation
- Current Assignee Address: US CA Santa Clara
- Agency: Jordan IP Law, LLC
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/48 ; G06K9/46 ; G06K9/36

Abstract:
Systems and methods may include utilizing a structured light pattern that may be, among other things, decoded in the three directions (e.g., vertical, horizontal, and diagonal). In one example, the method may include detecting a first feature of a target image in a return image, designating a feature type of the first feature, and an index with the letter, wherein the index is associated with the pattern slide. The method may also include calculating a horizontal position in the pattern slide of the first feature, calculating a vertical position in the pattern slide of the first feature, and calculating a depth of the first feature.
Public/Granted literature
- US20140003722A1 ANALYZING STRUCTURED LIGHT PATTERNS Public/Granted day:2014-01-02
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