Invention Grant
- Patent Title: Method and apparatus for detection of short stress waves
- Patent Title (中): 用于检测短应力波的方法和装置
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Application No.: US13421632Application Date: 2012-03-15
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Publication No.: US08880364B2Publication Date: 2014-11-04
- Inventor: Zbigniew Czyzewski
- Applicant: Zbigniew Czyzewski
- Agency: Howard & Howard Attorneys PLLC
- Main IPC: G01H1/12
- IPC: G01H1/12
Abstract:
Systems, apparatuses, and methods for measuring microscopic vibration of machines, which include the use of a selectable high pass or band pass filter and an average power processor unit, among other things.
Public/Granted literature
- US20120245867A1 METHOD AND APPARATUS FOR DETECTION OF SHORT STRESS WAVES Public/Granted day:2012-09-27
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