Invention Grant
- Patent Title: Test apparatus and test method
- Patent Title (中): 试验装置及试验方法
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Application No.: US13026160Application Date: 2011-02-11
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Publication No.: US08880375B2Publication Date: 2014-11-04
- Inventor: Kuniyuki Kaneko , Naoyoshi Watanabe
- Applicant: Kuniyuki Kaneko , Naoyoshi Watanabe
- Applicant Address: JP Tokyo
- Assignee: Advantest Corporation
- Current Assignee: Advantest Corporation
- Current Assignee Address: JP Tokyo
- Main IPC: G06F19/00
- IPC: G06F19/00 ; G11C29/56 ; G11C16/04

Abstract:
Provided is a test apparatus that tests a device under test having a plurality of output terminals. The test apparatus comprises an executing section that executes a test command sequence for testing the device under test; a storage section that stores a plurality of pieces of setting data designating one or more output terminals among the plurality of output terminals; a detecting section that detects whether a value of an output signal from an output terminal designated by one of the pieces of setting data matches an expected value; and a selecting section that selects different pieces of setting data in the storage section when at least two detection commands, which change execution sequencing of the test command sequence according to the detection results of the detecting section, are executed, and supplies the selected pieces of setting data to the detecting section.
Public/Granted literature
- US20110196640A1 TEST APPARATUS AND TEST METHOD Public/Granted day:2011-08-11
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