Invention for pattern recognition and artificial intelligence comprising: 1) storing data in parallel by applying a logic level (1) input or a logic level (0) input to one input of each of at least two exclusive-nor logic gates; 2) comparing data in parallel by applying a logic level (1) input or a logic level (0) input to the other input of each of the exclusive-nor gates, wherein each exclusive-nor gate produces a logic level (1) output when both inputs have the same datum input, and each exclusive-nor gate produces a logic level (0) output when both inputs have different datum input; and 3) measuring the outputs of the exclusive-nor logic gates collectively with a measuring apparatus, wherein the percentage of the pattern input for comparison which matches the pattern of data stored in the exclusive-nor gates is directly proportional to the magnitude of the collective output of the exclusive-nor gates.