Invention Grant
- Patent Title: Debugging a memory subsystem
- Patent Title (中): 调试内存子系统
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Application No.: US13204037Application Date: 2011-08-05
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Publication No.: US08880779B2Publication Date: 2014-11-04
- Inventor: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- Applicant: Anthony Fai , Nir Jacob Wakrat , Nicholas Seroff
- Applicant Address: US CA Cupertino
- Assignee: Apple Inc.
- Current Assignee: Apple Inc.
- Current Assignee Address: US CA Cupertino
- Agency: Meyertons, Hood, Kivlin, Kowert & Goetzel, P.C.
- Main IPC: G06F12/02
- IPC: G06F12/02 ; G06F11/263

Abstract:
In one implementation, a memory subsystem includes non-volatile memory, a memory controller that is communicatively connected to the non-volatile memory over a first bus, a host interface through which the memory controller communicates with a host controller over a second bus, and a joint test action group (JTAG) interface that provides the host controller with access to state information associated with the memory controller. The memory subsystem can be configured to be coupled to a board-level memory device that includes the host controller.
Public/Granted literature
- US20130036254A1 DEBUGGING A MEMORY SUBSYSTEM Public/Granted day:2013-02-07
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