Invention Grant
US08881075B2 Method for measuring assertion density in a system of verifying integrated circuit design 有权
一种验证集成电路设计系统中断言密度的方法

  • Patent Title: Method for measuring assertion density in a system of verifying integrated circuit design
  • Patent Title (中): 一种验证集成电路设计系统中断言密度的方法
  • Application No.: US13783635
    Application Date: 2013-03-04
  • Publication No.: US08881075B2
    Publication Date: 2014-11-04
  • Inventor: Yuan LuYong LiuNitin Mhaske
  • Applicant: Atrenta, Inc.
  • Applicant Address: US CA San Jose
  • Assignee: Atrenta, Inc.
  • Current Assignee: Atrenta, Inc.
  • Current Assignee Address: US CA San Jose
  • Agent Thomas Schneck; Mark Protsik
  • Main IPC: G06F9/455
  • IPC: G06F9/455 G06F17/50
Method for measuring assertion density in a system of verifying integrated circuit design
Abstract:
An assertion-based verification tool for circuit designs includes an effective measurement of assertion density for any given generated set of assertions. A register-transfer level (RTL) description of an integrated circuit (IC) is used to compute a set of predicates. Then, determination is made as to the number of predicates that are satisfiable on the given set of assertions received respective of the RTL description. Thereafter, simulation traces for the RTL are received and the number of predicates satisfiable on the simulation traces is computed. A figure of merit of assertion density is determined from the ratio of the respective numbers of predicates. The set of assertions may be modified as required to satisfy a predetermined threshold value of assertion density, to assure that a circuit is rigorously tested by the verification tool.
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