Invention Grant
US08885356B2 Enhanced stacked microelectronic assemblies with central contacts and improved ground or power distribution
有权
具有中心触点和改进的接地或功率分配的增强堆叠微电子组件
- Patent Title: Enhanced stacked microelectronic assemblies with central contacts and improved ground or power distribution
- Patent Title (中): 具有中心触点和改进的接地或功率分配的增强堆叠微电子组件
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Application No.: US13278514Application Date: 2011-10-21
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Publication No.: US08885356B2Publication Date: 2014-11-11
- Inventor: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- Applicant: Belgacem Haba , Wael Zohni , Richard Dewitt Crisp
- Applicant Address: US CA San Jose
- Assignee: Tessera, Inc.
- Current Assignee: Tessera, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Lerner, David, Littenberg, Krumholz & Mentlik, LLP
- Priority: KR10-2010-0129888 20101217
- Main IPC: H05K7/00
- IPC: H05K7/00 ; H01L25/065 ; H01L23/50 ; H01L23/498 ; H01L23/13 ; H05K1/14 ; H05K7/02 ; H01L23/00 ; H01L23/31

Abstract:
A microelectronic assembly includes a dielectric element, first and second microelectronic elements, signal leads, and one or more jumper leads. The dielectric element has oppositely-facing first and second surfaces and first and second apertures extend between the surfaces. A plurality of electrically conductive elements are positioned thereon. Signal leads are connected to one or more of the microelectronic elements and extend through one or more of the first or second apertures to some of the conductive elements on the dielectric element. One or more jumper leads extend through the first aperture and are connected to a contact of the first microelectronic element. The one or more jumper leads span over the second aperture and are connected to a conductive element on the dielectric element.
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