Invention Grant
US08885431B2 Semiconductor device changing an active time-out time interval 有权
半导体器件改变主动超时时间间隔

Semiconductor device changing an active time-out time interval
Abstract:
A device includes a plurality of memory areas each including a plurality of memory cells required to perform refresh of information stored therein by a plurality of sense amplifiers, a first control circuit determining, in connection with one refresh requirement signal at a time, a number of refresh-target memory areas to produce a determined number, a second control circuit controlling, in accordance with the one refresh requirement signal at a time, refresh operation with respect to the refresh-target memory areas, and a third control circuit adjusting, in connection with the refresh operation, an active time-out time interval according to the determined number. The active time-out time interval indicates a time interval from a first time instant when the sense amplifiers are activated to a second time instant when word lines related to the refresh-target memory areas are inactivated.
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