Invention Grant
- Patent Title: Device and method for testing APD measuring device
- Patent Title (中): 测试APD测量装置的装置和方法
-
Application No.: US13313303Application Date: 2011-12-07
-
Publication No.: US08886486B2Publication Date: 2014-11-11
- Inventor: Sunao Ronte , Satoru Arakawa
- Applicant: Sunao Ronte , Satoru Arakawa
- Applicant Address: JP Atsugi-Shi
- Assignee: Anritsu Corporation
- Current Assignee: Anritsu Corporation
- Current Assignee Address: JP Atsugi-Shi
- Agency: Pearne & Gordon LLP
- Priority: JP2011-072675 20110329
- Main IPC: G01C25/00
- IPC: G01C25/00 ; G01R23/16 ; G01R35/00

Abstract:
To accurately test the operating state of the APD measuring device. A test device 40 includes a test signal generator 41 that generates a test signal corresponding to the center frequency of a signal to be measured and a control unit 42 that variably controls the amplitude level of a test signal in the dynamic range of an APD measuring device 1 at random, in order to test the operating state of the APD measuring device 1.
Public/Granted literature
- US20120310583A1 DEVICE AND METHOD FOR TESTING APD MEASURING DEVICE Public/Granted day:2012-12-06
Information query