Invention Grant
- Patent Title: Low cost error-based program testing apparatus and method
- Patent Title (中): 低成本的基于错误的程序测试仪器和方法
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Application No.: US13550118Application Date: 2012-07-16
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Publication No.: US08886999B2Publication Date: 2014-11-11
- Inventor: Yu-Seung Ma , Seon-Tae Kim
- Applicant: Yu-Seung Ma , Seon-Tae Kim
- Applicant Address: KR Daejeon
- Assignee: Electronics and Telecommunications Research Institute
- Current Assignee: Electronics and Telecommunications Research Institute
- Current Assignee Address: KR Daejeon
- Agency: Staas & Halsey LLP
- Priority: KR10-2011-0085323 20110825
- Main IPC: G06F11/00
- IPC: G06F11/00 ; G06F11/263

Abstract:
A low cost error-based program testing apparatus and method are provided. The testing apparatus according to an embodiment of the present invention generates error programs by adding errors to a test target program, selects a test target error program associated with test data among the error programs using error information obtained through the error addition, receives the test data to execute the test target error program, and tests for presence/absence of the errors. Accordingly, it is possible to reduce a text execution time and testing costs.
Public/Granted literature
- US20130055027A1 LOW COST ERROR-BASED PROGRAM TESTING APPARATUS AND METHOD Public/Granted day:2013-02-28
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