Invention Grant
US08889347B2 Systems and methods for performing measurements of one or more materials
有权
用于执行一种或多种材料的测量的系统和方法
- Patent Title: Systems and methods for performing measurements of one or more materials
- Patent Title (中): 用于执行一种或多种材料的测量的系统和方法
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Application No.: US11757841Application Date: 2007-06-04
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Publication No.: US08889347B2Publication Date: 2014-11-18
- Inventor: Wayne D. Roth , Charles J. Collins , Dung Duong , Edward Calvin
- Applicant: Wayne D. Roth , Charles J. Collins , Dung Duong , Edward Calvin
- Applicant Address: US TX Austin
- Assignee: Luminex Corporation
- Current Assignee: Luminex Corporation
- Current Assignee Address: US TX Austin
- Agency: Parker Highlander PLLC
- Main IPC: C12Q1/68
- IPC: C12Q1/68 ; C12M1/36 ; G01N21/00 ; G01N33/543

Abstract:
Systems and methods for performing measurements of one or more materials are provided. One system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels. Another system is configured to image one or more materials in an imaging volume of a measurement device. An additional system is configured to substantially immobilize one or more materials in an imaging volume of a measurement device. A further system is configured to transfer one or more materials to an imaging volume of a measurement device from one or more storage vessels, to image the one or more materials in the imaging volume, to substantially immobilize the one or more materials in the imaging volume, or some combination thereof.
Public/Granted literature
- US20070281311A1 Systems and Methods for Performing Measurements of One or More Materials Public/Granted day:2007-12-06
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