Invention Grant
US08891314B2 Semiconductor memory device and operating method thereof 有权
半导体存储器件及其操作方法

  • Patent Title: Semiconductor memory device and operating method thereof
  • Patent Title (中): 半导体存储器件及其操作方法
  • Application No.: US13606100
    Application Date: 2012-09-07
  • Publication No.: US08891314B2
    Publication Date: 2014-11-18
  • Inventor: Kyoung Jin Park
  • Applicant: Kyoung Jin Park
  • Applicant Address: KR Gyeonggi-do
  • Assignee: SK Hynix Inc.
  • Current Assignee: SK Hynix Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2012-0029440 20120322
  • Main IPC: G11C11/34
  • IPC: G11C11/34
Semiconductor memory device and operating method thereof
Abstract:
A semiconductor memory device and the operating method thereof use a low pass voltage to boost a channel of unselected cell strings during a program operation, and boost the channel of the cell string by using the GIDL phenomenon, thereby reducing a disturbance influence on the memory cells connected to the unselected cell strings due to a high pass voltage.
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