Invention Grant
- Patent Title: Re-sampling S-parameters for serial data link analysis
- Patent Title (中): 重新采样S参数进行串行数据链路分析
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Application No.: US13531917Application Date: 2012-06-25
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Publication No.: US08891603B2Publication Date: 2014-11-18
- Inventor: Kan Tan , John J. Pickerd
- Applicant: Kan Tan , John J. Pickerd
- Applicant Address: US OR Beaverton
- Assignee: Tektronix, Inc.
- Current Assignee: Tektronix, Inc.
- Current Assignee Address: US OR Beaverton
- Agency: Meagher Emanuel Laks Roehling & Goldberg, LLP
- Agent Thomas F. Lenihan
- Main IPC: H04B3/46
- IPC: H04B3/46 ; H04B17/00 ; H04Q1/20

Abstract:
A device and method of re-sampling a plurality of S-parameters for serial data link analysis is disclosed. The method includes storing a plurality of S-parameters sets, each S-parameter set being associated with a subsystem and having associated impulse responses and a time interval. An increased time interval is determined based on the time interval associated with each S-parameter set. The impulse responses are zero filled in each S-parameter set to maintain any wrapped ripples and increase the time interval. A plurality of resampled S-parameter sets are generated with a finer frequency resolution to cover the increased time interval.
Public/Granted literature
- US20130343442A1 RE-SAMPLING S-PARAMETERS FOR SERIAL DATA LINK ANALYSIS Public/Granted day:2013-12-26
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