Invention Grant
- Patent Title: Reliable electrical fuse with localized programming
- Patent Title (中): 可靠的电熔丝与本地编程
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Application No.: US13095164Application Date: 2011-04-27
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Publication No.: US08896088B2Publication Date: 2014-11-25
- Inventor: Yan Zun Li , Zhengwen Li , Chengwen Pei , Jian Yu
- Applicant: Yan Zun Li , Zhengwen Li , Chengwen Pei , Jian Yu
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agent Yuanmin Cai; Edward A. Gecovich; Maeve L. McCarthy
- Main IPC: H01L23/52
- IPC: H01L23/52 ; H01L21/82 ; H01L21/84 ; H01L23/525 ; H01L27/12 ; G11C17/16

Abstract:
An electrical fuse has an anode contact on a surface of a semiconductor substrate. The electrical fuse has a cathode contact on the surface of the semiconductor substrate spaced from the anode contact. The electrical fuse has a link within the substrate electrically interconnecting the anode contact and the cathode contact. The link comprises a semiconductor layer and a silicide layer. The silicide layer extends beyond the anode contact. An opposite end of the silicide layer extends beyond the cathode contact. A silicon germanium region is embedded in the semiconductor layer under the silicide layer, between the anode contact and the cathode contact.
Public/Granted literature
- US20120275208A1 RELIABLE ELECTRICAL FUSE WITH LOCALIZED PROGRAMMING AND METHOD OF MAKING THE SAME Public/Granted day:2012-11-01
Information query
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