Invention Grant
- Patent Title: Optical characteristic measuring apparatus
- Patent Title (中): 光学特性测量仪器
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Application No.: US13861377Application Date: 2013-04-12
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Publication No.: US08896824B2Publication Date: 2014-11-25
- Inventor: Kazuaki Ohkubo , Hisashi Shiraiwa
- Applicant: Otsuka Electronics Co., Ltd.
- Applicant Address: JP Hirakata-Shi
- Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee: Otsuka Electronics Co., Ltd.
- Current Assignee Address: JP Hirakata-Shi
- Agency: Mori & Ward, LLP
- Priority: JP2012-160527 20120719
- Main IPC: G01J1/04
- IPC: G01J1/04 ; G02B17/00 ; G02B5/08

Abstract:
An optical characteristic measuring apparatus includes a hemispheric portion having a reflective surface on its inner wall, and a plane portion arranged to close an opening of the hemispheric portion and having a reflective surface on an inner-wall side of the hemispheric portion. The plane portion includes a first window occupying a range including a substantial center of curvature of the hemispheric portion for attaching a light source to the first window. At least one of the hemispheric portion and the plane portion includes a plurality of second windows arranged in accordance with a predetermined rule for extracting light from inside the hemispheric portion.
Public/Granted literature
- US20140021340A1 OPTICAL CHARACTERISTIC MEASURING APPARATUS Public/Granted day:2014-01-23
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