Invention Grant
- Patent Title: Microstructure analysis method, program thereof, and microstructure analysis device
- Patent Title (中): 微结构分析方法,程序及微结构分析装置
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Application No.: US13974527Application Date: 2013-08-23
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Publication No.: US08897549B2Publication Date: 2014-11-25
- Inventor: Satoshi Sakashita , Shingo Sokawa , Hiroyuki Nagaoka , Yuichiro Watanabe
- Applicant: NGK Insulators, Ltd.
- Applicant Address: JP Nagoya
- Assignee: NGK Insulators, Ltd.
- Current Assignee: NGK Insulators, Ltd.
- Current Assignee Address: JP Nagoya
- Agency: Burr & Brown, PLLC
- Priority: JP2012-082540 20120330
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06T7/00 ; G01N23/04 ; C04B38/00 ; C04B38/06 ; G01N15/08

Abstract:
Porous body data in which position information and type information are correlated is reference to take a curved surface solid including a parent virtual sphere and child virtual spheres as a virtual curved surface solid, and place multiple virtual curved surface solids so as to fill in space pixels with curved surface solid pixels occupied by virtual curved surface solids. Repeating this process, by placing multiple virtual curved surface solids within space in a porous body, the microstructure of the porous body is analyzed precisely. As for analysis, deriving of in-plane uniformity index γx, spatial uniformity index γ, pressure drop P, flow-through velocity T, and equivalent diameter d, for example, and acceptability determination based on derived values thereof, is performed.
Public/Granted literature
- US20130336578A1 MICROSTRUCTURE ANALYSIS METHOD, PROGRAM THEREOF, AND MICROSTRUCTURE ANALYSIS DEVICE Public/Granted day:2013-12-19
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