Invention Grant
- Patent Title: Method for correcting a defect pixel
- Patent Title (中): 纠正缺陷像素的方法
-
Application No.: US13197811Application Date: 2011-08-04
-
Publication No.: US08897592B2Publication Date: 2014-11-25
- Inventor: Byoung Seok Yoo , Jae-Gwan Jeon , Bong-Ju Jun
- Applicant: Byoung Seok Yoo , Jae-Gwan Jeon , Bong-Ju Jun
- Applicant Address: KR
- Assignee: Samsung Display Co., Ltd.
- Current Assignee: Samsung Display Co., Ltd.
- Current Assignee Address: KR
- Agency: Cantor Colburn LLP
- Priority: KR10-2011-0031756 20110406
- Main IPC: G06K9/00
- IPC: G06K9/00 ; G06K9/40 ; G06K9/62 ; H04N9/64 ; G06T5/00 ; H04N1/407 ; H04N1/409 ; H04N5/367 ; H04N9/04

Abstract:
A method for correcting a defect pixel includes extracting a pixel value of a central pixel, and pixel values of each of a plurality of neighboring pixels around the central pixel in an image sensor by using a color filter; calculating reference levels by multiplying each the pixel value of the plurality of neighboring pixels by a weight value; calculating a total number of cases where the pixel value of the central pixel is larger or smaller than the reference level as a first comparison value or second comparison value, respectively; determining the central pixel is a defect pixel where the first or second comparison value is larger than a first or second control register value, by comparing the comparison values with the control register values, respectively; and correcting the central pixel determined as the defect pixel.
Public/Granted literature
- US20120257825A1 METHOD FOR CORRECTING A DEFECT PIXEL Public/Granted day:2012-10-11
Information query