Invention Grant
- Patent Title: Radiation measurement system
- Patent Title (中): 辐射测量系统
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Application No.: US13961326Application Date: 2013-08-07
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Publication No.: US08901500B2Publication Date: 2014-12-02
- Inventor: Kenichi Moteki , Shohei Katayama
- Applicant: Mitsubishi Electric Corporation
- Applicant Address: JP Chiyoda-Ku, Tokyo
- Assignee: Mitsubishi Electric Corporation
- Current Assignee: Mitsubishi Electric Corporation
- Current Assignee Address: JP Chiyoda-Ku, Tokyo
- Agency: Buchanan Ingersoll & Rooney
- Priority: JP2013-76585 20130402
- Main IPC: G01T1/16
- IPC: G01T1/16 ; G01T1/20 ; G01T1/185

Abstract:
In order to obtain a radiation measurement system in which a shield is reduced in size to achieve reduction in cost and missing measurement is not present in the whole measurement range, and which is good in stability and responsiveness, a radiation detector which is low in measurement range of radiation is arranged in a sample vessel in which a sample gas serving as a radiation measurement object is made to flow; a radiation detector, which is high in measurement range having a measurement range that follows the radiation detector which is low in measurement range of radiation, is arranged outside the sample vessel; and the sample vessel and a plurality of the radiation detectors are surrounded by a shield to shield from environmental radiation.
Public/Granted literature
- US20140291530A1 RADIATION MEASUREMENT SYSTEM Public/Granted day:2014-10-02
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