Invention Grant
- Patent Title: Variable resistive memory device
- Patent Title (中): 可变电阻式存储器件
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Application No.: US13753712Application Date: 2013-01-30
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Publication No.: US08901526B2Publication Date: 2014-12-02
- Inventor: Ki-hyung Nam , Yong-kwan Kim , Ho-joong Lee , Pulunsol Cho
- Applicant: Ki-hyung Nam , Yong-kwan Kim , Ho-joong Lee , Pulunsol Cho
- Applicant Address: KR Gyeonggi-do
- Assignee: Samsung Electronics Co., Ltd.
- Current Assignee: Samsung Electronics Co., Ltd.
- Current Assignee Address: KR Gyeonggi-do
- Agency: Harness, Dickey & Pierce, P.L.C.
- Priority: KR10-2012-0020401 20120228
- Main IPC: H01L29/00
- IPC: H01L29/00 ; H01L45/00 ; H01L27/22

Abstract:
A variable resistive memory device capable of reducing contact resistance by including a contact layer having low contact resistance, the variable resistive memory device including a substrate comprising an active region; a gate line on the substrate; a first contact layer electrically connected to the active region; a memory cell contact plug electrically connected to the first contact layer; and a variable resistive memory cell electrically connected to the memory cell contact plug, wherein the first contact layer has less contact resistance with respect to the active region than the memory cell contact plug.
Public/Granted literature
- US20130221306A1 VARIABLE RESISTIVE MEMORY DEVICE Public/Granted day:2013-08-29
Information query
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