Invention Grant
- Patent Title: Charge compensation semiconductor device
- Patent Title (中): 充电补偿半导体器件
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Application No.: US13414037Application Date: 2012-03-07
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Publication No.: US08901642B2Publication Date: 2014-12-02
- Inventor: Hans Weber , Franz Hirler
- Applicant: Hans Weber , Franz Hirler
- Applicant Address: AT Villach
- Assignee: Infineon Technologies Austria AG
- Current Assignee: Infineon Technologies Austria AG
- Current Assignee Address: AT Villach
- Agency: Murphy, Bilak & Homiller, PLLC
- Main IPC: H01L29/78
- IPC: H01L29/78

Abstract:
A semiconductor device includes a semiconductor body having a first surface defining a vertical direction and a source metallization arranged on the first surface. In a vertical cross-section the semiconductor body further includes: a drift region of a first conductivity type; at least two compensation regions of a second conductivity type each of which forms a pn-junction with the drift region and is in low resistive electric connection with the source metallization; a drain region of the first conductivity type having a maximum doping concentration higher than a maximum doping concentration of the drift region, and a third semiconductor layer of the first conductivity type arranged between the drift region and the drain region and includes at least one of a floating field plate and a floating semiconductor region of the second conductivity type forming a pn-junction with the third semiconductor layer.
Public/Granted literature
- US20130234239A1 Charge Compensation Semiconductor Device Public/Granted day:2013-09-12
Information query
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