Invention Grant
- Patent Title: Integrated circuit and manufacturing method thereof
- Patent Title (中): 集成电路及其制造方法
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Application No.: US11785866Application Date: 2007-04-20
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Publication No.: US08901704B2Publication Date: 2014-12-02
- Inventor: Hee Bok Kang
- Applicant: Hee Bok Kang
- Applicant Address: KR Gyeonggi-do
- Assignee: SK Hynix Inc.
- Current Assignee: SK Hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2006-0036278 20060421; KR10-2006-0036279 20060421; KR10-2006-0036874 20060424; KR10-2007-0015440 20070214
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L27/115 ; H01L27/105

Abstract:
An integrated circuit and a manufacturing method thereof are provided. A chip size can be reduced by forming a memory device in which a ferroelectric capacitor region is laminated on a DRAM. The integrated circuit includes a cell array region having a capacitor, a peripheral circuit region, and a ferroelectric capacitor region being formed on an upper layer of the cell array region and the peripheral circuit region, and having a ferroelectric capacitor device.
Public/Granted literature
- US20070252185A1 Integrated circuit and manufacturing method thereof Public/Granted day:2007-11-01
Information query
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