Invention Grant
US08901704B2 Integrated circuit and manufacturing method thereof 有权
集成电路及其制造方法

  • Patent Title: Integrated circuit and manufacturing method thereof
  • Patent Title (中): 集成电路及其制造方法
  • Application No.: US11785866
    Application Date: 2007-04-20
  • Publication No.: US08901704B2
    Publication Date: 2014-12-02
  • Inventor: Hee Bok Kang
  • Applicant: Hee Bok Kang
  • Applicant Address: KR Gyeonggi-do
  • Assignee: SK Hynix Inc.
  • Current Assignee: SK Hynix Inc.
  • Current Assignee Address: KR Gyeonggi-do
  • Agency: IP & T Group LLP
  • Priority: KR10-2006-0036278 20060421; KR10-2006-0036279 20060421; KR10-2006-0036874 20060424; KR10-2007-0015440 20070214
  • Main IPC: H01L21/02
  • IPC: H01L21/02 H01L27/115 H01L27/105
Integrated circuit and manufacturing method thereof
Abstract:
An integrated circuit and a manufacturing method thereof are provided. A chip size can be reduced by forming a memory device in which a ferroelectric capacitor region is laminated on a DRAM. The integrated circuit includes a cell array region having a capacitor, a peripheral circuit region, and a ferroelectric capacitor region being formed on an upper layer of the cell array region and the peripheral circuit region, and having a ferroelectric capacitor device.
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